“I am very proud that 50 years ago
I was among those who graduated this university which was called higher technical education institution
and got a referral to industry.”



N.A. Nazarbayev

Rector's blog

For the period of 50 years Karaganda State Industrial University, founded in 1963, has become one of the leading hig...

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Laboratory of an engineering profile



 Equipment 

More than 200 million tenges of budgetary funds are spent for laboratory creation in 2008. The university contributed to laboratory fund the unique equipment of global manufacturers.

Electronic translucent microscope JEM2100. The increase in a microscope from 50 to 1500000 times allows to study completely nuclear and crystal structure of a material, inclusive morphology and the characteristic of crystal structure, the characteristic of type and distribution of different defects of a crystal structure (border of grains, defects of packing, a dislocation, different combinations of dot defects), and also to carry out the chemical analysis of the particles which were allocated in alloys and different inclusions (including gas bubbles, emptiness), to study domain structure.

Objects of research of a translucent microscope: the high-disperse powders besieged on a slick substrate after special operation, oxide slicks – a foil, slicks of metals, the thin slicks received from massive objects by chemical thinning, a remark, that is the thin slicks reproducing a relief of a surface of studied object.

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The scanning (raster) electronic microscope of JSM 5910 allows to observe surface topography owing to a big deep  of focus. There is a possibility of research of thin details of structure. It is possible to study and receive pictures of volume images and structure configurations.

The microscope is also intended for studying of subthin structure at the level of the crystallographic plates. It defines quantitative and qualitative structure of phases and residual tension at phase transformations.

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The diffractometer x-ray of general purpose DRON-6 is intended for carrying out the X-ray diffraction analysis of crystal and amorphous materials in research, educational and factory laboratories, in lines of technological control.

By the X-ray diffraction analysis define and/or estimate: qualitative and quantitative phase structure; parameters of an elementary cell; parameters of thin structure – the size and distribution of areas of coherent dispersion and microdeformations, concentration of deformation and twinning defects of packing; density and distribution of dislocations; size of macrotension (tension of the I sort); maintenance of an amorphous and crystal phase; texture; orientation of monocrystals and other parameters.

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The analyzer of a chemical composition of  SPECTROLAB is intended for definition of a chemical composition of alloys on the basis of iron, aluminum, copper and zinc with addition to 20 alloying elements (Cr, V, W, S, P, C, Nb, Mo, Ni, Ti, As, etc.). It is a desktop optical issue spectrometer for the analysis of metals and alloys with range excitement in a spark and/or an arch and semiconductor CCD detectors. Optimum range of lengths of waves from 175 to 550 nanometers plus detectors for alkaline and alkaline-land elements.

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The optical microscope  “LEICA”. The Optical microscope “LEICA” is intended for research of phase structure and structural features of metals and alloys at increase from х100 to х1000 times. The microscope is equipped with a prefix for determination of microhardness of separate phases, and also a prefix for automatic microphotographing of a microstructure.

For the educational purposes it is equipped with a color videosystem of SONY and the television screen on which the image from a microscope is projected.

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Optical metalgraphic microscope of  Olympus

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The complex x-ray measuring “RIKOR” is intended for measurements of angular provisions of diffraction peaks arising from influence of the x-ray radiation directed on analyzed object. The received angular provisions of peaks form a basis for definition of phase structure of studied substance.

Scope – quality control of process of production of materials for microelectronics, cement, chemical, mining and processing, pharmaceutical industry, metallurgy.

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The educational universal tortional and explosive MI-40KU car is intended for test of samples for stretching, compression and torsion. The car is used together with IBM – compatible and provides creation of schedules of dependence of effort and the moment from deformation on the display via the standard RS 232 interface at stretching or compression of samples with a force up to 40 kN at a speed of loading of 0,5 … 60 mm/min., and torsion with the moment to 200 Nanometers at a speed of loading of 0,03 … 6 rpm.

The car allows to make the following measurements automatically: values of linear movement traverses; values of the current loading of F current; values of angular movement of capture of torsion; value of a present situation of M current.

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The universal measuring microscope of UIM-23 (UIM-200E type) intends for measurement of the linear and angular sizes of various products in rectangular and polar coordinates. In particular, on a microscope it is possible to measure the various carving products, cutting tool, profile templates and curves, cones, taps, thread-cutting combs, etc.

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The detachable Lobotom-3 machine – the high-precision detachable machine intended for exact cutting of metals without deformation with a hardness from 30 to 2000 HV. The detachable machine allows to receive the cut having an equal, minimum deformed surface. Abrasive wet cutting provides a minimum of damages of a surface that facilitates and accelerates further preparation of samples.

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High-precision detachable machine Accutom-5

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The grinding and polishing Tegra Pol machine – Tegra Force of Struers firm is intended for the high-quality automated grinding and polishing. The machine is used with application of grinding disks and polishing cloth on magnetic fixing of MD System.

The machine allows to make  material graphic preparation of materials with a hardness of 30 – 2000 HV.

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Device of electrolytic sample preparation Struers 

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Буклет по оборудованию (pdf)